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A two-step in situ measurement method for temperature and thermal stress of power device based on a single Raman peak
Publication with shared reference
10.1016/j.ijheatmasstransfer.2023.124555
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Publications
A two-step in situ measurement method for temperature and thermal stress of power device based on a single Raman peak
Publication with shared reference
10.1016/j.ijheatmasstransfer.2023.124555
Publications with shared reference:
A two-step in situ measurement method for temperature and thermal stress of power device based on a single Raman peak
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