Photothermal mirage characterization of vertical interfaces separating two different media
- 15 January 1996
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 79 (2) , 599-608
Abstract
A theoretical and experimental study about the ability of the photothermal modulated mirage technique to characterize vertical interfaces (thermal resistances) separating two different opaque and thermally thick media with thermal conductivities larger than the medium surrounding the sample and with any value in their thermal diffusivities has been carried out. For the calculation of the mirage deflection, a theoretical model that incorporates the mirage parameters (sizes of probe and pump beams, probe beam height) and which is valid for any value of the thermal resistance characterizing the interface is presented. The model is validated by experimental measurements on a fabricated sample having a controlled interface width that separates two pieces of copper and steel. Fitting the model calculations and the experimental data allows one to retrieve the value of the thermal resistance.Keywords
This publication has 8 references indexed in Scilit:
- Micron-scale thermal characterizations of interfaces parallel or perpendicular to the surfaceJournal of Applied Physics, 1995
- Photothermal microscopy: Thermal contrast at grain interface in sintered metallic materialsJournal of Applied Physics, 1994
- Photothermal measurements near a 90° edge. II. Characterization of subsurface rectangular voids and close planar cracksJournal of Applied Physics, 1993
- Photothermal measurements near a 90° edge. I. Mirage deflection by a free edgeJournal of Applied Physics, 1993
- Photothermal Investigations of Realistic Interfaces1992
- Photothermal detection and characterization of a horizontal buried slab by the mirage techniqueJournal of Applied Physics, 1991
- Photothermal beam-deflection imaging of vertical interfaces in solidsCanadian Journal of Physics, 1986
- Thermal wave imaging of closed cracks in opaque solidsJournal of Applied Physics, 1983