Quantifying protein adsorption on combinatorially sputtered Al-, Nb-, Ta- and Ti-containing films with electron microprobe and spectroscopic ellipsometry
Authors:
- T.M. ByrneTBT.M. Byrne
- L. LohstreterLLL. Lohstreter
- M.J. FiliaggiMFM.J. Filiaggi
- Zhijun BaiZBZhijun Bai
- J.R. DahnJDJ.R. Dahn
- 1 April 2009
- journal article
- Published by Elsevier in Surface Science
- Vol. 603 (7) , 992-1001
Abstract
No abstract availableKeywords
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