Local order in hydrogenated amorphous germanium thin films studied by extended x-ray absorption fine-structure spectroscopy

This publication has 27 references indexed in Scilit:

• The Perspectives of Hydrogenated Amorphous Germanium as an Electronic Material
  Physica Status Solidi (b), 1995
• Hydrogen and deuterium incorporation and release processes in r.f.-sputtered hydrogenated or deuterated amorphous germanium films
  Philosophical Magazine Part B, 1993
• Cumulant analysis of the extended x-ray-absorption fine structure of β-AgI
  Physical Review B, 1993
• Structural properties of amorphous hydrogenated germanium
  Journal of Non-Crystalline Solids, 1992
• Role of hydrogen in the formation of metastable defects in hydrogenated amorphous silicon
  Physical Review B, 1989
• Structural Study of Amorphous Ge Using Extended X-Ray Absorption Fine Structure
  Journal of the Physical Society of Japan, 1987
• Spectroscopie du chrome très ionisé : niveaux d'énergie de la configuration 2p531 de Cr XV
  Journal de Physique, 1986
• Structural study of hydrogenateda-Ge using extended x-ray absorption fine structure
  Physical Review B, 1984
• Application of the ratio method of EXAFS analysis to disordered systems
  Nuclear Instruments and Methods in Physics Research, 1983
• EXAFS investigation of amorphous-to-crystal transition in Ge
  Solid State Communications, 1981