Analysis of electronic parameters and frequency-dependent properties of Au/NiO/n-GaN heterojunctions
- 2 January 2018
- journal article
- research article
- Published by Springer Nature in Applied Physics A
- Vol. 124 (1) , 79
Abstract
No abstract availableThis publication has 48 references indexed in Scilit:
- Properties of p-NiO/n-GaN Diodes Fabricated by Magnetron SputteringChinese Physics Letters, 2012
- Electrical characterization of the Al/new fuchsin/n-Si organic-modified devicePhysica E: Low-dimensional Systems and Nanostructures, 2010
- Electrical characteristics of Al/polyindole Schottky barrier diodes. I. Temperature dependenceJournal of Applied Polymer Science, 2009
- On the profile of frequency dependent series resistance and surface states in Au/Bi4Ti3O12/SiO2/n-Si(MFIS) structuresMicroelectronic Engineering, 2008
- The calculation of electronic properties of an Ag/chitosan/n-Si Schottky barrier diodeSynthetic Metals, 2007
- Solid-state dye-sensitized solar cell with p-type NiO as a hole collectorSolar Energy Materials and Solar Cells, 2005
- AlGaN ∕ GaN metal-oxide-semiconductor heterostructure field-effect transistor with oxidized Ni as a gate insulatorApplied Physics Letters, 2004
- Electrical characterization of anodically grown native oxide on GaInSbSolid-State Electronics, 1998
- Frequency dependence of forward capacitance-voltage characteristics of Schottky barrier diodesSolid-State Electronics, 1993
- On the difference in apparent barrier height as obtained from capacitance-voltage and current-voltage-temperature measurements on Al/p-InP Schottky barriersSolid-State Electronics, 1986