50 years of elastic recoil detection: How it started
Authors:
- Jacques L’éCuyerJLJacques L’éCuyer
- Barney DoyleBDBarney Doyle
- Jean-Pierre MartinJMJean-Pierre Martin
- Sjoerd RoordaSRSjoerd Roorda
- François SchiettekatteFSFrançois Schiettekatte
Open Access
- 28 March 2026
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 575
Abstract
No abstract availableFunding Information
- Nature et technologies
- Natural Sciences and Engineering Research Council of Canada
- National Nuclear Security Administration (DE-NA0003525)
- Université de Montréal
- International Union of Pure and Applied Physics
- U.S. Department of Energy
- International Atomic Energy Agency
This publication has 18 references indexed in Scilit:
- ERDA 40 years agoNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2017
- Nuclear reaction analysis for H, Li, Be, B, C, N, O and F with an RBS checkNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2016
- Time-of-flight ERD with a 200 mm2 Si3N4 window gas ionization chamber energy detectorNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2014
- Fast Monte Carlo for ion beam analysis simulationsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2008
- Monte Carlo simulation of multiple and plural scattering in elastic recoil detectionNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2001
- Time-of-flight system for profiling recoiled light elementsNuclear Instruments and Methods in Physics Research, 1983
- High resolution depth profiling of light elements in high atomic mass materialsNuclear Instruments and Methods in Physics Research, 1983
- Hydrogen concentration profiles and chemical bonding in silicon nitrideJournal of Electronic Materials, 1979
- Wavelength-dispersion analysis of pixe spectraNuclear Instruments and Methods, 1977
- Measurement of the depth distribution of light impurities in first-wall materials: He in NbJournal of Nuclear Materials, 1976