Analysis of SOI CMOS microprocessor's SEE sensitivity: Correlation of the results obtained by different test methods
- 1 September 2011
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 03796566,p. 665-668
Abstract
The results on SEE sensitivity of 0.5 μm SOI CMOS microprocessor are presented and discussed. The comparative analysis of different test techniques (particle accelerator, pulsed laser technique and 252 Cf fission source) is provided for the cache. The possible sources of discrepancies between test results and the ways of data correction and methods of testing techniques' accuracy improvement are discussed.Keywords
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