NiO as a test case for high resolution resonant inelastic soft x-ray scattering
Authors:
- G GhiringhelliGGG Ghiringhelli
- M MatsubaraMMM Matsubara
- C DalleraCDC Dallera
- F FracassiFFF Fracassi
- R GusmeroliRGR Gusmeroli
- A PiazzalungaAPA Piazzalunga
- A TagliaferriATA Tagliaferri
- N B BrookesNBN B Brookes
- A KotaniAKA Kotani
- L BraicovichLBL Braicovich
- 19 August 2005
- journal article
- Published by IOP Publishing in Journal of Physics: Condensed Matter
- Vol. 17 (35) , 5397-5412
Abstract
No abstract availableThis publication has 39 references indexed in Scilit:
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