An Area-Efficient Design of Enhanced Space-Time Redundant DFF (IEST_TMR DFF)
Authors:
- 22 April 2022
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 721-726
Abstract
In the Application Specific Integrated Circuit (ASIC) design of spacecraft, anti-radiation performance is a very important factor, and Triple Modular Redundancy (TMR) is a common radiation hardened method, which can well resist the Single Event Upset (SEU) in sequential units. However, conventional TMR cannot eliminate Single Event Transient (SET) pulses that occur in combinational logic. So, varieties of improved schemes have been proposed, including the Space-Time TMR (ST_TMR), the Enhanced Space-Time TMR (EST_TMR), and TMR_5DFF. However, ST_TMR and EST_TMR will cause timing errors in specific cases, and the area cost of TMR_5DFF is too large. Therefore, this paper proposes an area-efficient Improved Enhanced Space-Time TMR (IEST_TMR) scheme based on EST_TMR, which can not only solve the timing errors of EST_TMR, but also reduce the area cost compared with TMR_5DFF. In order to verify the validity of IEST_TMR, this paper uses the Soft Error Rate (SER) analysis method based on double exponential current source and the C17 circuit in ISCAS'85 as the test circuit to analyze the SER of the circuit using IEST_TMR DFF. In addition, we implement a simple anti-radiation Universal Asynchronous Receiver/Transmitter (UART) module by using the method of the Second Synthesis of Modified Netlist (SSMN), and further verify the validity of the IEST_TMR DFF by injecting faults in the back-end simulation.Keywords
Funding Information
- Innovation Fund
- Fundamental Research Funds for the Central Universities
This publication has 10 references indexed in Scilit:
- Fully Single Event Double Node Upset Tolerant Design for Magnetic Random Access Memory2021
- Radiation Hardened Design Based on TMR_5DFF for ASIC2019
- Improving the Effectiveness of TMR Designs on FPGAs with SEU-Aware Incremental Placement2018
- Automated design flow for applying Triple Modular Redundancy (TMR) in complex digital circuits2018
- Scan-chain-based multiple error recovery in TMR systems (SMERTMR)2014
- Soft Error Rate Analysis for Combinational Logic Using An Accurate Electrical Masking Model2007
- Two New Space-Time Triple Modular Redundancy Techniques for Improving Fault Tolerance of Computer Systems2006
- A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits2004
- Impact of scaling on soft-error rates in commercial microprocessorsIEEE Transactions on Nuclear Science, 2002
- Upset hardened memory design for submicron CMOS technologyIEEE Transactions on Nuclear Science, 1996