Corrections to “Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications”
- 1 January 2025
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 74, 1
Abstract
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- Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement ApplicationsIEEE Transactions on Instrumentation and Measurement, 2025