Application of supply current testing to analogue circuits, towards a structural analogue test methodology
Authors:
- H. ManhaeveHMH. Manhaeve
- J. VerfaillieJVJ. Verfaillie
- B. StrakaBSB. Straka
- J.P. CornilJCJ.P. Cornil
- 20 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Towards an effective I/sub DDQ/ test vector selection and application methodology2002
- An off-chip IDDq current measurement unit for telecommunication ASICs2002
- Off chip monitors and built in current sensors for analogue and mixed signal testing2002
- Analog test design with I/sub DD/ measurements for the detection of parametric and catastrophic faults2002