Double-Layer-Stacked Silicon Interposer for 2.5-D Packaging of 32 × 32 Micromirror Array Chip
- 4 February 2025
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Packaging and Manufacturing Technology
- Vol. 15 (4) , 706-715
Abstract
Aimed at packaging our previously-developed bulk-silicon-micromachined 32×32 micromirror array (MMA) chip (33×34×0.4mm3 in dimension and 4114 pads) while minimizing coefficient of thermal expansion (CTE) mismatch, this paper, for the first time, develops a double-layer-stacked silicon interposer (DLSSI), which is 49.8×49.8×0.387mm3 in dimension and has 8 redistribution layers (RDLs). It is realized by fabricating two single-layered silicon interposers (SLSIs) with 175μm-thickness core layer and 4 RDLs equally arranged on both sides, and then adopting Cu-Sn bonding to integrate them together. Such design improves the thickness and the number of RDLs of silicon interposer. Thus, the DLSSI not only has higher structural strength for guaranteeing itself to go through packaging process intactly, but also has higher routing capability for numerous and complicated electric interconnections. Herein, the total quantity of electrical interconnections in the DLSSI is 8336. A dimension-by-dimension fan-out strategy is proposed, which successfully maps pads of the 32×32 MMA chip to their corresponding pads of high voltage ASICs (HV-ASICs) in 4 RDLs (the rest 4 RDLs are for powers, reference voltages and control signals of the HV-ASICs). The equivalent CTE of the DLSSI is calculated to be 3.5ppm/℃, and the theoretical warpage of the 32×32 MMA chip after the packaging process is calculated to be about 3μm with full-scale finite element analysis (FEA). Besides, the warpage and conductance yield of the DLSSI are measured experimentally. Based on the DLSSI, a vertically integrated 32×32 MMA module that includes a PCB connector, 16 HV-ASICs and 80 capacitors is developed successfully.Keywords
Funding Information
- Shanghai Sailing Program (No. 20YF1456600)
This publication has 24 references indexed in Scilit:
- Finite element modeling and analysis method for predicting and optimizing the warpage of construction before flip chip bonding in System-on-Wafer process flowMicroelectronics Reliability, 2023
- 2.3D Hybrid Substrate with Ajinomoto Build-Up Film for Heterogeneous Integration2022
- Design for Reliability of Solder Joints2020
- 3D Packaging of Embedded Opto-Electronic Die and CMOS IC Based on Wet Etched Silicon Interposer2017
- Inkjet printing technology for increasing the I/O density of 3D TSV interposersMicrosystems & Nanoengineering, 2017
- An overview of through-silicon-via technology and manufacturing challengesMicroelectronic Engineering, 2015
- Assembly and reliability challenges in 3D integration of 28nm FPGA die on a large high density 65nm passive interposer2012
- Studies on electrical performance and thermal stress of a silicon interposer with TSVs2010
- 3D silicon integration2008
- The physical properties of composite materialsJournal of Materials Science, 1976