High-resolution Kelvin probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP)
Authors:
- Michael RohwerderMRMichael Rohwerder
Top Cited Papers
- 1 December 2007
- journal article
- Published by Elsevier in Electrochimica Acta
- Vol. 53 (2) , 290-299
Abstract
No abstract availableKeywords
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