Passivity of Metals, Alloys, and Semiconductors
Authors:
- 21 February 2003
- book chapter
- Published by Wiley
Abstract
The sections in this article are Introduction: Definition of Passivity: Survey of Systems: General Principles of Passivity: Thermodynamics and Bond Polarity: Experimental Techniques for Characterization of Passive Films: Thickness and Stoichiometry of Passive Films: Chemistry, Crystal Structure and Aging: Chemistry and Crystal Structure: Aging: Potential Distribution at the Interface: Electrochemical and Chemical Reactions in Passive Systems: Reactions: Current Densities i : Ionic Properties, Migration and Ion‐Transfer Reactions: Electronic Behavior and ETR: Band Structure of Oxide Films: Electron‐Transfer Reactions ETR at Oxide Films: Mixed Ionic/Electronic Conductivity: Equivalent Circuit Diagrams: Growth of Oxide Films and Ionic Migration: Survey on the Growth of Oxide Films: Insulating Passive Films on Metals: Growth, and Corrosion of Al as Example: Thermodynamic Aspects: A Survey on Oxide Formation from CVs: The Film Formation Factor k : Electrochemical Impedance Spectra EIS and Equivalent Circuit Diagram: Kinetics of Film Growth: Corrosion and Breakdown: Porous Aluminum Oxide: Other Types of Passive Aluminum Oxide Films, Anof, Modified Aluminum, Alloys: Other Systems: Other Metals Forming Insulating Oxide Films: Semiconducting and Metallic Oxide Films on Metals: Duplex Films: Passivation with Participation of the Electrolyte: Semiconductors: Passivation of Alloys: ITR at the Homogeneous Oxide/Electrolyte Interface: Corrosion and Modification: Passive Corrosion in the Steady State: Corrosion during Oxide Growth: Oxide Reduction and Oxidation: Modification of Oxide Films by ITR of Other Ions: Corrosion at Inhomogeneous Films: Breakdown, Pitting and Localized Attack: Microscopic and Molecular Reasons for Local Corrosion: Dielectric Breakdown: Collision ionization model: Tunnel model for thin films: Pitting Corrosion: Cathodic Breakdown: Laser Induced Breakdown or Oxide Growth: Applications: Conclusions: Acknowledgments:Keywords
This publication has 125 references indexed in Scilit:
- Neutron irradiation damage in aluminum oxide and nitride ceramics up to a fluence of 4.2×10Journal of Nuclear Materials, 2000
- Dimensional changes of Al2O3, MgO, MgAl2O4, AlN and Si3N4 by helium implantationNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2000
- Depth distribution of Cu, Ag and Au ions implanted at low energy into insulatorsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2000
- Aluminium oxide tunnel junctions: influence of preparation technique, sample geometry and oxide thicknessThin Solid Films, 1999
- Concerning the Distribution of the Overpotential during Anodic Oxide Film GrowthJournal of the Electrochemical Society, 1990
- Direct observation of the two-layer structure of anodic oxide films on tantalumPhilosophical Magazine A, 1989
- Electron-Beam-Induced crystallization of anodic barrier films on aluminiumThin Solid Films, 1981
- Die Bewegung der Ionengitter von Isolatoren bei extremen elektrischen Feldst rkenThe European Physical Journal A, 1934
- Neue Untersuchungen ber die elektrolytische VentilwirkungThe European Physical Journal A, 1931
- Studien über die Anomalien im Verhalten der DielektrikaAnnalen der Physik, 1907