Recent improvements to the Cambridge University 600 kV High Resolution Electron Microscope
Authors:
- 1 May 1983
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 130 (2) , 127-136
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Procedures for focusing, stigmating and alignment in high resolution electron microscopyJournal of Microscopy, 1983
- The high resolution electron microscopy of stacking defects in Cu–Zn–Al shape memory alloyJournal of Microscopy, 1983
- The importance of beam alignment and crystal tilt in high resolution electron microscopyUltramicroscopy, 1983
- Optimisation and applications of the Cambridge University 600 kV high resolution electron microscopeUltramicroscopy, 1982
- Atomic Resolution with the Electron MicroscopeInterdisciplinary Science Reviews, 1981
- Principles and performance of a 600 kV high resolution electron microscopeProceedings of the Royal Society of London. A. Mathematical and Physical Sciences, 1980
- High resolution imaging of amorphous materialsNature, 1979
- A practical procedure for alignment of a high resolution electron microscopeUltramicroscopy, 1979
- Electron-optical imaging of Ti6O11at 1·6 Å point-to-point resolutionPhilosophical Magazine A, 1978
- Coma-free alignment of high resolution electron microscopes with the aid of optical diffractogramsUltramicroscopy, 1978