The importance of beam alignment and crystal tilt in high resolution electron microscopy
Authors:
- David J. SmithDSDavid J. Smith
- W.M. StobbsWSW.M. Stobbs
- 1 January 1983
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 11 (4) , 263-281
Abstract
No abstract availableKeywords
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