New SEU Modeling Method for Calibrating Target System to Multiple Radiation Particles
- 18 November 2019
- journal article
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 67 (1) , 44-49
Abstract
This paper proposes a method using electron and proton Single Event Upset sensitivities of a device to deduce all simulation parameters related to an RPP approach. It is shown that for 45-nm DDR memory, the RPP approach is still relevant and the crossing of proton and electron data makes it possible to constrain and properly define the associated parameters. Heavy-ion prediction is also presented.Keywords
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