Stuck-open and transition fault testing in CMOS complex gates
Authors:
- H. CoxHCH. Cox
- J. RajskiJRJ. Rajski
- 6 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 688-694
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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