A refined plan-view specimen preparation technique for high-quality electron microscopy studies of epitaxially grown atomically thin 2D layers
Authors:
- 18 October 2024
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 267, 114063
Abstract
No abstract availableKeywords
Funding Information
- Ministry of Education and Science of the Russian Federation
- FSBSI Directorate of State Scientific and Technical Programs (FSMR-2024-0004)
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