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A refined plan-view specimen preparation technique for high-quality electron microscopy studies of epitaxially grown atomically thin 2D layers
Publication with shared reference
10.1016/j.ultramic.2024.114063
Home
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A refined plan-view specimen preparation technique for high-quality electron microscopy studies of epitaxially grown atomically thin 2D layers
Publication with shared reference
10.1016/j.ultramic.2024.114063
Publications with shared reference:
A refined plan-view specimen preparation technique for high-quality electron microscopy studies of epitaxially grown atomically thin 2D layers
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