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Structure and Stability of Thin Praseodymium Oxide Layers on Si(001)
Home
Publications
Structure and Stability of Thin Praseodymium Oxide Layers on Si(001)
Structure and Stability of Thin Praseodymium Oxide Layers on Si(001)
Authors:
HM
Hans Joachim Müssig
Hans Joachim Müssig
JD
Jaroslaw Dąbrowski
Jaroslaw Dąbrowski
KI
K. Ignatovich
K. Ignatovich
JL
J.P. Liu
J.P. Liu
VZ
V. Zavodinsky
V. Zavodinsky
HO
H.J. Osten
H.J. Osten
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1 November 2001
journal article
Published by
Trans Tech Publications, Ltd.
in
Solid State Phenomena
Vol. 82-84
,
783-788
DOI:
10.4028/www.scientific.net/ssp.82-84.783
Abstract
No abstract available
Keywords
AB INITIO SIMULATION
AES
HETEROEPITAXIAL GROWTH
HIGH-K GATE MATERIAL
INITIAL STAGES
STM
X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)
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