Hamaker Constants in Integrated Circuit Metalization
Authors:
- Stephen P. BeaudoinSBStephen P. Beaudoin
- 1 April 2002
- journal article
- research article
- Published by Elsevier in Journal of Colloid and Interface Science
- Vol. 248 (2) , 389-397
Abstract
No abstract availableKeywords
This publication has 29 references indexed in Scilit:
- Origins and Applications of London Dispersion Forces and Hamaker Constants in CeramicsJournal of the American Ceramic Society, 2000
- Hamaker constants of inorganic materialsAdvances in Colloid and Interface Science, 1997
- Identification of electrostatic and van der Waals interaction forces between a micrometer-size sphere and a flat substratePhysical Review B, 1996
- Metal-Parylene Interconnection SystemsMRS Proceedings, 1995
- Full spectral calculation of non-retarded Hamaker constants for ceramic systems from interband transition strengthsSolid State Ionics, 1995
- Measurement of the adhesion and removal forces of submicrometer particles on silicon substratesJournal of Adhesion Science and Technology, 1993
- Measurement of forces in liquids using a force microscopeLangmuir, 1992
- Atomistic Mechanisms and Dynamics of Adhesion, Nanoindentation, and FractureScience, 1990
- The calculation of hamaker constants from liftshitz theory with applications to wetting phenomenaAdvances in Colloid and Interface Science, 1980
- On Hamaker constants: A comparison between Hamaker constants and Lifshitz-van der Waals constantsAdvances in Colloid and Interface Science, 1972