Effects of proton beam irradiation on the physical and chemical properties of IGTO thin films with different thicknesses for thin-film transistor applications
Authors:
- Min-Gyu ShinMSMin-Gyu Shin
- Seong-Hyun HwangSHSeong-Hyun Hwang
- Hyun-Seok ChaHCHyun-Seok Cha
- Hwan-Seok JeongHJHwan-Seok Jeong
- Dae-Hwan KimDKDae-Hwan Kim
- Hyuck-In KwonHKHyuck-In Kwon
- 1 April 2021
- journal article
- research article
- Published by Elsevier in Surfaces and Interfaces
- Vol. 23
Abstract
No abstract availableKeywords
Funding Information
- National Research Foundation of Korea
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