Model based quantification of EELS spectra
- 1 November 2004
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 101 (2-4) , 207-224
Abstract
No abstract availableKeywords
This publication has 22 references indexed in Scilit:
- Improved background-fitting algorithms for ionization edges in electron energy-loss spectraUltramicroscopy, 2002
- Multiple least-squares fitting for quantitative electron energy-loss spectroscopy — an experimental investigation using standard specimensUltramicroscopy, 1995
- The potential and limitations of neutrons, electrons and X-rays for atomic resolution microscopy of unstained biological moleculesQuarterly Reviews of Biophysics, 1995
- Background problem in electron-energy-loss spectroscopyPhysical Review B, 1993
- Influence of some practical factors on background extrapolation in EELS quantificationJournal of Microscopy, 1987
- Electron energy loss analysis of near-trace-element concentrations of calciumUltramicroscopy, 1987
- Weighted least squares estimation of background in EELS imagingJournal of Microscopy, 1985
- Optimized acquisition parameters and statistical detection limit in quantitative EELSJournal of Microscopy, 1984
- A revised expression for signal/noise ratio in EELSUltramicroscopy, 1982
- Zur Theorie des Durchgangs schneller Korpuskularstrahlen durch MaterieAnnalen der Physik, 1930