Tunnelling charge injection into a pentacene layer using dynamic-mode scanning force microscopy
Authors:
- Takao KusakaTKTakao Kusaka
- Kaoru OjimaKOKaoru Ojima
- Takuya MatsumotoTMTakuya Matsumoto
- Tomoji KawaiTKTomoji Kawai
- 30 January 2007
- journal article
- Published by IOP Publishing in Nanotechnology
- Vol. 18 (9)
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Few electrons injection in silicon nanocrystals probed by ultrahigh vacuum atomic force microscopyApplied Physics Letters, 2005
- Writing polarization bits on the multiferroic BiMnO3 thin film using Kelvin probe force microscopeApplied Physics Letters, 2004
- Probing Nanoscale Dipole-Dipole Interactions by Electric Force MicroscopyPhysical Review Letters, 2004
- Kelvin probe force microscopy study of SrBi2Ta2O9 and PbZr0.53Ti0.47O3 thin films for high-density nonvolatile storage devicesApplied Physics Letters, 2003
- Quantitative evaluation of local charge trapping in dielectric stacked gate structures using Kelvin probe force microscopyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 2002
- Localized charge injection in SiO2 films containing silicon nanocrystalsApplied Physics Letters, 2001
- Conducting atomic force microscopy studies on local electrical properties of ultrathin SiO2 filmsApplied Surface Science, 2000
- Scanning capacitance microscope study of a SiO 2 /Si interface modified by charge injectionApplied Physics A, 1998
- High Density Charge Storage Memory with Scanning Probe MicroscopyJapanese Journal of Applied Physics, 1996
- Charge storage in a nitride-oxide-silicon medium by scanning capacitance microscopyJournal of Applied Physics, 1991