Lateral and depth scale calibration of the position sensitive atom probe
Authors:
- J.M. HydeJHJ.M. Hyde
- A. CerezoACA. Cerezo
- R.P. SetnaRSR.P. Setna
- P.J. WarrenPWP.J. Warren
- G.D.W. SmithGSG.D.W. Smith
- 1 March 1994
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 76-77, 382-391
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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