New structural model for the Si(111)4×1–In reconstruction

This publication has 22 references indexed in Scilit:

• Dynamic observation of In adsorption on Si(111) surfaces by UHV high-temperature scanning tunneling microscopy
  Surface Science, 1996
• The growth and atomic structure of the Si(1 1 1)-indium interface studied by surface X-ray diffraction
  Physica B: Condensed Matter, 1994
• 4×1 reconstruction of indium deposited on vicinal Si(111) surfaces
  Physical Review B, 1993
• The growth of indium on the Si(111) surface studied by X-ray reflectivity and Auger electron spectroscopy
  Surface Science, 1992
• Structure analysis of the single-domain Si(111)4 × 1-In surface by μ-probe Auger electron diffraction and μ-probe reflection high energy electron diffraction
  Surface Science, 1991
• Si(111)-(4×1)In surface reconstruction studied by impact-collision ion-scattering spectrometry
  Physical Review B, 1991
• Metal‐induced reconstructions of the silicon(111) surface
  Journal of Microscopy, 1988
• Electron energy loss measurements of In/Si(111) superstructures: Correlation of the spectra with surface superstructures
  Applied Surface Science, 1988
• Indium-induced reconstructions of the Si(111) surface studied by scanning tunneling microscopy
  Physical Review B, 1987
• Superstructures of submonolayer indium films on silicon (111)7 surfaces
  Applied Physics Letters, 1979