Imaging Ferroelectric Nanodomains in Strained BiFeO3 Nanoscale Films Using Scanning Low-Energy Electron Microscopy: Implications for Low-Power Devices
- 2 April 2021
- journal article
- research article
- Published by American Chemical Society (ACS) in ACS Applied Nano Materials
- Vol. 4 (4) , 3725-3733
Abstract
No abstract availableKeywords
Funding Information
- Technology Agency of the Czech Republic (TN01000008)
- Guangzhou Municipal Science and Technology Program key projects (2019050001, 201906010016)
- National Natural Science Foundation of China (91963102, U1832104)
- Guangdong Science and Technology Project (2019A050510036)
- Guangdong Provincial Key Laboratory of Optical Information Materials and Technology, South China Normal University (2017B030301007)
This publication has 44 references indexed in Scilit:
- One-dimensional multiferroic bismuth ferrite fibers obtained by electrospinning techniquesNanotechnology, 2011
- Room-temperature ferromagnetic/ferroelectric BiFeO3 synthesized by a self-catalyzed fast reaction processJournal of Materials Chemistry, 2010
- Static states and dynamic behaviour of charges: observation and control by scanning probe microscopyJournal of Physics: Condensed Matter, 2010
- Imaging ferroelectric domains in multiferroics using a low‐energy electron microscope in the mirror operation modePhysica Status Solidi (RRL) – Rapid Research Letters, 2010
- Direct Scanning Electron Microscopy Imaging of Ferroelectric Domains After Ion MillingJournal of the American Ceramic Society, 2009
- Neutron scattering studies of BiFeO3 multiferroics: a review for microscopistsJournal of Microscopy, 2009
- Model-based SEM for dimensional metrology tasks in semiconductor and mask industryJournal of Physics D: Applied Physics, 2009
- Controlled Patterning of Ferroelectric Domains: Fundamental Concepts and ApplicationsAnnual Review of Materials Research, 2008
- Acquisition of the Angular Distribution of Backscattered Electrons at Low EnergiesMATERIALS TRANSACTIONS, 2007
- simion for the personal computer in reflectionInternational Journal of Mass Spectrometry, 2000