Eliška Mikmeková
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Eliška Mikmeková has a total of 103 co-authors. Here are the top co-authors by number of shared publications:
- I. Müllerová
Institute of Scientific Instruments AS CR, Královopolská 147, 612 64 Brno, Czech Republic
10 shared publications - Ivo Konvalina
Institute of Scientific Instruments of the CAS, Kràlovopolskà 147, 612 64 Brno, Czech Republic
7 shared publications - Tewodros Asefa
Department of Chemistry and Chemical Biology & Department of Chemical and Biochemical Engineering Rutgers The State University of New Jersey Piscataway New Jersey USA
6 shared publications - Anandarup Goswami
Department of Chemistry, School of Applied Science and Humanities, Vignan’s Foundation for Science, Technology and Research (Deemed to be University), Vadlamudi, Guntur 522 213, India
4 shared publications L. Frank
4 shared publications- Ludek Frank
Institute of Scientific Instruments of the Czech Academy of Sciences, Královopolská 147, 612 64 Brno, Czech Republic
4 shared publications
Latest Publications
- Open Access
- 22 April 2026
- Published by MDPI AG in Nanomaterials
- Vol. 16 (9) , 501
Advanced Characterization of 2D Materials Using SLEEM/ToF
Two-dimensional (2D) materials exhibit electronic and collective excitation properties that are highly sensitive to surface chemistry and thickness, requiring surface-sensitive characterization at low electron energies. Here, we investigate graphene, hexagonal boron nitride (h-BN), molybdenum disulfide (MoS2), and titanium carbide (Ti3C2) MXene using an advanced home-built scanning low-energy electron microscopy system combined with time-of-flight electron spectroscopy (SLEEM/ToF). The system uniquely records electron energy-loss spectra (EELS) from transmitted electrons rather than from the reflected electrons used in conventional SLEEM. Compared with high-energy EELS, our low-energy ToF-EELS approach offers enhanced surface sensitivity and reduced beam-induced damage, enabling direct probing of π and π + σ plasmon excitations. Additionally, complementary techniques, including scanning transmission electron microscopy (STEM), Raman spectroscopy, and X-ray photoelectron spectroscopy (XPS), were employed to characterize structural and chemical properties. EELS were acquired for all investigated 2D materials at electron landing energies of 500–1500 eV, and in the 5–50 eV range for selected materials, including graphene and MoS2. Analysis of these spectra enabled determination of the average plasmon positions across the measured energy range for all studied materials. Furthermore, a quantitative determination of the inelastic mean free path (IMFP) was achieved for graphene in the 10–50 eV range, yielding a value of 1.9 ± 0.2 nm. These results demonstrate the potential of SLEEM–ToF for surface-sensitive analysis of 2D materials.
- 22 April 2026
- Published by MDPI AG in Nanomaterials
- Vol. 16 (9) , 501
Open AccessAdvanced Characterization of 2D Materials Using SLEEM/ToF
Two-dimensional (2D) materials exhibit electronic and collective excitation properties that are highly sensitive to surface chemistry and thickness, requiring surface-sensitive characterization at low electron energies. Here, we investigate graphene, hexagonal boron nitride (h-BN), molybdenum disulfide (MoS2), and titanium carbide (Ti3C2) MXene using an advanced home-built scanning low-energy electron microscopy system combined with time-of-flight electron spectroscopy (SLEEM/ToF). The system uniquely records electron energy-loss spectra (EELS) from transmitted electrons rather than from the reflected electrons used in conventional SLEEM. Compared with high-energy EELS, our low-energy ToF-EELS approach offers enhanced surface sensitivity and reduced beam-induced damage, enabling direct probing of π and π + σ plasmon excitations. Additionally, complementary techniques, including scanning transmission electron microscopy (STEM), Raman spectroscopy, and X-ray photoelectron spectroscopy (XPS), were employed to characterize structural and chemical properties. EELS were acquired for all investigated 2D materials at electron landing energies of 500–1500 eV, and in the 5–50 eV range for selected materials, including graphene and MoS2. Analysis of these spectra enabled determination of the average plasmon positions across the measured energy range for all studied materials. Furthermore, a quantitative determination of the inelastic mean free path (IMFP) was achieved for graphene in the 10–50 eV range, yielding a value of 1.9 ± 0.2 nm. These results demonstrate the potential of SLEEM–ToF for surface-sensitive analysis of 2D materials.
- 6 March 2025
- Published by American Physical Society (APS) in Physical Review B
- Vol. 111 (12)
Ab initio study of angle-resolved electron reflection spectroscopy of few-layer graphene
- 6 March 2025
- Published by American Physical Society (APS) in Physical Review B
- Vol. 111 (12)
Ab initio study of angle-resolved electron reflection spectroscopy of few-layer graphene
- Open Access
- 11 July 2024
- Published by MDPI AG in Machine Learning and Knowledge Extraction
- Vol. 6 (3) , 1579-1596
Deep Learning-Powered Optical Microscopy for Steel Research
The success of machine learning (ML) models in object or pattern recognition naturally leads to ML being employed in the classification of the microstructure of steel surfaces. Light optical microscopy (LOM) is the traditional imaging process in this field. However, the increasing use of ML to extract or relate more aspects of the aforementioned materials and the limitations of LOM motivated us to provide an improvement to the established image acquisition process. In essence, we perform style transfer from LOM to scanning electron microscopy (SEM) combined with “intelligent” upscaling. This is achieved by employing an ML model trained on a multimodal dataset to generate an SEM-like image from the corresponding LOM image. This transformation, in our opinion, which is corroborated by a detailed analysis of the source, target and prediction, successfully pushes the limits of LOM in the case of steel surfaces. The expected consequence is the improvement of the precise characterization of advanced multiphase steels’ structure based on these transformed LOM images.
- 11 July 2024
- Published by MDPI AG in Machine Learning and Knowledge Extraction
- Vol. 6 (3) , 1579-1596
Open AccessDeep Learning-Powered Optical Microscopy for Steel Research
The success of machine learning (ML) models in object or pattern recognition naturally leads to ML being employed in the classification of the microstructure of steel surfaces. Light optical microscopy (LOM) is the traditional imaging process in this field. However, the increasing use of ML to extract or relate more aspects of the aforementioned materials and the limitations of LOM motivated us to provide an improvement to the established image acquisition process. In essence, we perform style transfer from LOM to scanning electron microscopy (SEM) combined with “intelligent” upscaling. This is achieved by employing an ML model trained on a multimodal dataset to generate an SEM-like image from the corresponding LOM image. This transformation, in our opinion, which is corroborated by a detailed analysis of the source, target and prediction, successfully pushes the limits of LOM in the case of steel surfaces. The expected consequence is the improvement of the precise characterization of advanced multiphase steels’ structure based on these transformed LOM images.
- Open Access
- 28 December 2021
- Published by MDPI AG in Nanomaterials
- Vol. 12 (1) , 71
Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors
The segmented semiconductor detectors for transmitted electrons in ultrahigh resolution scanning electron microscopes allow observing samples in various imaging modes. Typically, two standard modes of objective lens, with and without a magnetic field, differ by their resolution. If the beam deceleration mode is selected, then an electrostatic field around the sample is added. The trajectories of transmitted electrons are influenced by the fields below the sample. The goal of this paper is a quantification of measured images and theoretical study of the capability of the detector to collect signal electrons by its individual segments. Comparison of measured and ray-traced simulated data were difficult in the past. This motivated us to present a new method that enables better comparison of the two datasets at the cost of additional measurements, so-called calibration curves. Furthermore, we also analyze the measurements acquired using 2D pixel array detector (PAD) that provide a more detailed angular profile. We demonstrate that the radial profiles of STEM and/or 2D-PAD data are sensitive to material composition. Moreover, scattering processes are affected by thickness of the sample as well. Hence, comparing the two experimental and simulation data can help to estimate composition or the thickness of the sample.
- 28 December 2021
- Published by MDPI AG in Nanomaterials
- Vol. 12 (1) , 71
Open AccessQuantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors
The segmented semiconductor detectors for transmitted electrons in ultrahigh resolution scanning electron microscopes allow observing samples in various imaging modes. Typically, two standard modes of objective lens, with and without a magnetic field, differ by their resolution. If the beam deceleration mode is selected, then an electrostatic field around the sample is added. The trajectories of transmitted electrons are influenced by the fields below the sample. The goal of this paper is a quantification of measured images and theoretical study of the capability of the detector to collect signal electrons by its individual segments. Comparison of measured and ray-traced simulated data were difficult in the past. This motivated us to present a new method that enables better comparison of the two datasets at the cost of additional measurements, so-called calibration curves. Furthermore, we also analyze the measurements acquired using 2D pixel array detector (PAD) that provide a more detailed angular profile. We demonstrate that the radial profiles of STEM and/or 2D-PAD data are sensitive to material composition. Moreover, scattering processes are affected by thickness of the sample as well. Hence, comparing the two experimental and simulation data can help to estimate composition or the thickness of the sample.
- Open Access
- 18 September 2021
- Published by MDPI AG in Nanomaterials
- Vol. 11 (9) , 2435
Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer
The detailed examination of electron scattering in solids is of crucial importance for the theory of solid-state physics, as well as for the development and diagnostics of novel materials, particularly those for micro- and nanoelectronics. Among others, an important parameter of electron scattering is the inelastic mean free path (IMFP) of electrons both in bulk materials and in thin films, including 2D crystals. The amount of IMFP data available is still not sufficient, especially for very slow electrons and for 2D crystals. This situation motivated the present study, which summarizes pilot experiments for graphene on a new device intended to acquire electron energy-loss spectra (EELS) for low landing energies. Thanks to its unique properties, such as electrical conductivity and transparency, graphene is an ideal candidate for study at very low energies in the transmission mode of an electron microscope. The EELS are acquired by means of the very low-energy electron microspectroscopy of 2D crystals, using a dedicated ultra-high vacuum scanning low-energy electron microscope equipped with a time-of-flight (ToF) velocity analyzer. In order to verify our pilot results, we also simulate the EELS by means of density functional theory (DFT) and the many-body perturbation theory. Additional DFT calculations, providing both the total density of states and the band structure, illustrate the graphene loss features. We utilize the experimental EELS data to derive IMFP values using the so-called log-ratio method.
- 18 September 2021
- Published by MDPI AG in Nanomaterials
- Vol. 11 (9) , 2435
Open AccessLow-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer
The detailed examination of electron scattering in solids is of crucial importance for the theory of solid-state physics, as well as for the development and diagnostics of novel materials, particularly those for micro- and nanoelectronics. Among others, an important parameter of electron scattering is the inelastic mean free path (IMFP) of electrons both in bulk materials and in thin films, including 2D crystals. The amount of IMFP data available is still not sufficient, especially for very slow electrons and for 2D crystals. This situation motivated the present study, which summarizes pilot experiments for graphene on a new device intended to acquire electron energy-loss spectra (EELS) for low landing energies. Thanks to its unique properties, such as electrical conductivity and transparency, graphene is an ideal candidate for study at very low energies in the transmission mode of an electron microscope. The EELS are acquired by means of the very low-energy electron microspectroscopy of 2D crystals, using a dedicated ultra-high vacuum scanning low-energy electron microscope equipped with a time-of-flight (ToF) velocity analyzer. In order to verify our pilot results, we also simulate the EELS by means of density functional theory (DFT) and the many-body perturbation theory. Additional DFT calculations, providing both the total density of states and the band structure, illustrate the graphene loss features. We utilize the experimental EELS data to derive IMFP values using the so-called log-ratio method.
- 2 April 2021
- Published by American Chemical Society (ACS) in ACS Applied Nano Materials
- Vol. 4 (4) , 3725-3733
Imaging Ferroelectric Nanodomains in Strained BiFeO3 Nanoscale Films Using Scanning Low-Energy Electron Microscopy: Implications for Low-Power Devices
- 2 April 2021
- Published by American Chemical Society (ACS) in ACS Applied Nano Materials
- Vol. 4 (4) , 3725-3733
Imaging Ferroelectric Nanodomains in Strained BiFeO3 Nanoscale Films Using Scanning Low-Energy Electron Microscopy: Implications for Low-Power Devices
- Open Access
- 30 July 2020
- Published by Oxford University Press (OUP) in Microscopy and Microanalysis
- Vol. 26 (S2) , 2682-2684
Treatment and Observation of Advanced Carbon-based Nanomaterials by Slow Electrons
- 30 July 2020
- Published by Oxford University Press (OUP) in Microscopy and Microanalysis
- Vol. 26 (S2) , 2682-2684
Open AccessTreatment and Observation of Advanced Carbon-based Nanomaterials by Slow Electrons
- 22 May 2020
- Published by Wiley in Angewandte Chemie
- Vol. 132 (35) , 15110-15117
A Blinking Mesoporous TiO2−x Composed of Nanosized Anatase with Unusually Long‐Lived Trapped Charge Carriers
A mesoporous TiO2−x material comprised of small, crystalline, vacancy‐rich anatase nanoparticles (NPs) shows unique optical, thermal, and electronic properties. It is synthesized using polymer‐derived mesoporous carbon (PDMC) as a template. The PDMC pores serve as physical barriers during the condensation and pyrolysis of a titania precursor, preventing the titania NPs from growing beyond 10 nm in size. Unlike most titania nanomaterials, during pyrolysis the NPs undergo no transition from the anatase to rutile phase and they become catalytically active reduced TiO2−x. When exposed to a slow electron beam, the NPs exhibit a charge/discharge behavior, lighting up and fading away for an average period of 15 s for an extended period of time. The NPs also show a 50 nm red‐shift in their UV/Vis absorption and long‐lived charge carriers (electrons and holes) at room temperature in the dark, even long after UV irradiation. The NPs as photocatalysts show a good activity for CO2 reduction.
- 22 May 2020
- Published by Wiley in Angewandte Chemie
- Vol. 132 (35) , 15110-15117
A Blinking Mesoporous TiO2−x Composed of Nanosized Anatase with Unusually Long‐Lived Trapped Charge Carriers
A mesoporous TiO2−x material comprised of small, crystalline, vacancy‐rich anatase nanoparticles (NPs) shows unique optical, thermal, and electronic properties. It is synthesized using polymer‐derived mesoporous carbon (PDMC) as a template. The PDMC pores serve as physical barriers during the condensation and pyrolysis of a titania precursor, preventing the titania NPs from growing beyond 10 nm in size. Unlike most titania nanomaterials, during pyrolysis the NPs undergo no transition from the anatase to rutile phase and they become catalytically active reduced TiO2−x. When exposed to a slow electron beam, the NPs exhibit a charge/discharge behavior, lighting up and fading away for an average period of 15 s for an extended period of time. The NPs also show a 50 nm red‐shift in their UV/Vis absorption and long‐lived charge carriers (electrons and holes) at room temperature in the dark, even long after UV irradiation. The NPs as photocatalysts show a good activity for CO2 reduction.
- 22 May 2020
- Published by Wiley in Angewandte Chemie International Edition
- Vol. 59 (35) , 15000-15007
A Blinking Mesoporous TiO2−x Composed of Nanosized Anatase with Unusually Long‐Lived Trapped Charge Carriers
A mesoporous TiO2−x material comprised of small, crystalline, vacancy‐rich anatase nanoparticles (NPs) shows unique optical, thermal, and electronic properties. It is synthesized using polymer‐derived mesoporous carbon (PDMC) as a template. The PDMC pores serve as physical barriers during the condensation and pyrolysis of a titania precursor, preventing the titania NPs from growing beyond 10 nm in size. Unlike most titania nanomaterials, during pyrolysis the NPs undergo no transition from the anatase to rutile phase and they become catalytically active reduced TiO2−x. When exposed to a slow electron beam, the NPs exhibit a charge/discharge behavior, lighting up and fading away for an average period of 15 s for an extended period of time. The NPs also show a 50 nm red‐shift in their UV/Vis absorption and long‐lived charge carriers (electrons and holes) at room temperature in the dark, even long after UV irradiation. The NPs as photocatalysts show a good activity for CO2 reduction.
- 22 May 2020
- Published by Wiley in Angewandte Chemie International Edition
- Vol. 59 (35) , 15000-15007
A Blinking Mesoporous TiO2−x Composed of Nanosized Anatase with Unusually Long‐Lived Trapped Charge Carriers
A mesoporous TiO2−x material comprised of small, crystalline, vacancy‐rich anatase nanoparticles (NPs) shows unique optical, thermal, and electronic properties. It is synthesized using polymer‐derived mesoporous carbon (PDMC) as a template. The PDMC pores serve as physical barriers during the condensation and pyrolysis of a titania precursor, preventing the titania NPs from growing beyond 10 nm in size. Unlike most titania nanomaterials, during pyrolysis the NPs undergo no transition from the anatase to rutile phase and they become catalytically active reduced TiO2−x. When exposed to a slow electron beam, the NPs exhibit a charge/discharge behavior, lighting up and fading away for an average period of 15 s for an extended period of time. The NPs also show a 50 nm red‐shift in their UV/Vis absorption and long‐lived charge carriers (electrons and holes) at room temperature in the dark, even long after UV irradiation. The NPs as photocatalysts show a good activity for CO2 reduction.
- 1 May 2020
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 241, 146836
Acquisition of the dopant contrast in semiconductors with slow electrons
- 1 May 2020
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 241, 146836
Acquisition of the dopant contrast in semiconductors with slow electrons