Estimating soft-mode frequencies of surface overlayers by means of photoelectron diffraction: The(2×2)surface-V2O3/Pd(111)
- 16 October 2003
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 68 (15) , 155417
Abstract
The surface- layer, an interface-mediated vanadium oxide phase observed on Pd(111) in the submonolayer coverage range, has been investigated by means of angle scanned x-ray photoelectron diffraction (XPD), which gives a direct experimental confirmation of the model derived by scanning tunnelling microscopy (STM) and density functional calculations (DFT), with a quantitative determination of the V-O interlayer spacing. In addition, XPD measurements compared to single scattering cluster–spherical wave (SSC-SW) simulations revealed a peculiar broadening of V-O forward scattering (FS) maxima that is limited to azimuthal scans and that cannot be accounted for by isotropic Debye-Waller attenuation of the diffraction features. However, the existence of a soft phonon mode in the overlayer, associated with substantial in-plane displacements from equilibrium of O scatterers with respect to V emitters, could explain the experimental observation. The existence of such a soft mode has been confirmed by DFT calculations. It consists of an in-plane quasirotation around the V emitter of the three nearest-neighbor O atoms, and the estimated DFT frequency amounts to The XPD data have been analyzed by means of SSC-SW simulations wherein a harmonic oscillator model has been employed to approximate the effect of the soft phonon mode on XPD curves. As a result, an experimental determination of the frequency of the mode has been obtained which is of the same order of magnitude as the DFT predicted frequency. Moreover, the sensitivity of XPD scans to the correlation of soft-mode atomic displacements has been studied, leading to the estimate of a “soft-mode XPD coherence length” for the system under investigation. This work therefore explores an application of XPD as a surface spectroscopy sensitive to vibrational soft modes.
Keywords
This publication has 14 references indexed in Scilit:
- A photoelectron diffraction study of the surface-V2O3 (2×2) layer on Pd(111)Surface Science, 2003
- Surface structures of ultrathin vanadium oxide films on Pd()Surface Science, 2001
- First-principles calculations for VxOy grown on Pd(111)Surface Science, 2001
- Novel Interface-Mediated Metastable Oxide Phases: Vanadium Oxides on Pd(111)Physical Review Letters, 2001
- Nature, growth, and stability of vanadium oxides on Pd(111)Journal of Vacuum Science & Technology A, 1999
- Angle‐Scanned Photoelectron Diffraction: Probing crystalline ultrathin filmsAdvanced Materials, 1996
- Surface carboxylate species on Cu(100) studied by angle-scanned photoelectron diffraction and LCAO-LDF calculationsSurface Science, 1994
- Final-state effects in photoelectron diffractionJournal of Electron Spectroscopy and Related Phenomena, 1990
- Spherical-wave corrections in photoelectron diffractionPhysical Review B, 1989
- Surface structure refinements of 2HMoS2, 2HNbSe2 and W(100)p(2 × 1)O via new reliability factors for surface crystallographySurface Science, 1977