Corrections to "Unified Analysis of Time-Dependent Dielectric Breakdown to Extend Reliability Margins"

Authors:

Publisher website

1 November 2026

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices

Vol. 73 (11) , 7200
DOI:10.1109/ted.2026.3733227

Abstract

No abstract available

This publication has 1 reference indexed in Scilit:

Unified Analysis of Time-Dependent Dielectric Breakdown to Extend Reliability Margins
IEEE Transactions on Electron Devices, 2025