Engineering Ultra-Low Work Function of Graphene
Authors:
- Hongyuan YuanHYHongyuan Yuan
- Shuai ChangSCShuai Chang
- Ning C. WangNWNing C. Wang
- Daniel C. RileyDRDaniel C. Riley
- Haotian WangHWHaotian Wang
- Jared W. SchwedeJSJared W. Schwede
- J. ProvineJPJ. Provine
- Eric PopEPEric Pop
- Zhi-Xun ShenZSZhi-Xun Shen
- Nicholas A. MeloshNMNicholas A. Melosh
- 29 September 2015
- journal article
- research article
- Published by American Chemical Society (ACS) in Nano Letters
- Vol. 15 (10) , 6475-6480
Abstract
Low work function materials are critical for energy conversion and electron emission applications. Here, we demonstrate for the first time that an ultralow work function graphene is achieved by combining electrostatic gating with a Cs/O surface coating. A simple device is built from large-area monolayer graphene grown by chemical vapor deposition, transferred onto 20 nm HfO2 on Si, enabling high electric fields capacitive charge accumulation in the graphene. We first observed over 0.7 eV work function change due to electrostatic gating as measured by scanning Kelvin probe force microscopy and confirmed by conductivity measurements. The deposition of Cs/O further reduced the work function, as measured by photoemission in an ultrahigh vacuum environment, which reaches nearly 1 eV, the lowest reported to date for a conductive, nondiamond material.Keywords
Funding Information
- Stanford University
- Air Force Office of Scientific Research (FA9550-14-1-0251)
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