Diode laser-based standoff absorption measurement of water film thickness in retro-reflection
- 13 September 2016
- journal article
- research article
- Published by Springer Nature in Applied Physics B
- Vol. 122 (9) , 1-7
Abstract
No abstract availableKeywords
Funding Information
- Deutsche Forschungsgemeinschaft (SCHU 1369/16-1)
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