Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework
Authors:
- A.J. Den DekkerADA.J. Den Dekker
- S. Van AertSAS. Van Aert
- A. van Den BosABA. van Den Bos
- D. Van DyckDDD. Van Dyck
- 1 September 2005
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 104 (2) , 83-106
Abstract
No abstract availableKeywords
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