Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: A practical example
Authors:
- S. Van AertSAS. Van Aert
- A.J. Den DekkerADA.J. Den Dekker
- A. van Den BosABA. van Den Bos
- D. Van DyckDDD. Van Dyck
- J.H. ChenJCJ.H. Chen
- 1 September 2005
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 104 (2) , 107-125
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Experimental design of exit wave reconstruction from a transmission electron microscope defocus seriesIEEE Transactions on Instrumentation and Measurement, 1994
- An autofocus method for a TEMUltramicroscopy, 1987