Microstructure of amorphous and microcrystalline Si and SiGe alloys using X-rays and neutrons
Author:
- D.L WilliamsonDWD.L Williamson
- 1 July 2003
- journal article
- Published by Elsevier in Solar Energy Materials and Solar Cells
- Vol. 78 (1-4) , 41-84
Abstract
No abstract availableKeywords
This publication has 73 references indexed in Scilit:
- Quantitative ASAXS of germanium inhomogeneities in amorphous silicon–germanium alloysJournal of Non-Crystalline Solids, 2001
- Small-Angle Neutron Scattering from Device-Quality a-Si:H and a-Si:D Prepared by PECVD and HWCVDMRS Proceedings, 2000
- Medium-Range Order in a-Si:H Below and Above the Onset of MicrocrystallinityMRS Proceedings, 1999
- Small-Angle Neutron Scattering Studies on Thin Films of Isotopic Polystyrene BlendsMacromolecules, 1998
- Nanostructured Ge distribution in a-SiGe:H alloys from anomalous small-angle X-ray scattering studiesSolid State Communications, 1998
- The 30 m Small-Angle Neutron Scattering Instruments at the National Institute of Standards and TechnologyJournal of Applied Crystallography, 1998
- Optical determination of the mass density of amorphous and microcrystalline silicon layers with different hydrogen contentsJournal of Non-Crystalline Solids, 1998
- Nanostructure of a-Si:H and Related Materials by Small-Angle X-Ray ScatteringMRS Proceedings, 1995
- JUSIFA—A new user-dedicated ASAXS beamline for materials scienceReview of Scientific Instruments, 1989
- Hydrogen content and density of plasma-deposited amorphous silicon-hydrogenJournal of Applied Physics, 1979