Just-in-Time Catching Test Generation at Meta
Authors:
- Matthew BeckerMBMatthew Becker
- Yifei ChenYCYifei Chen
- Nicholas CochranNCNicholas Cochran
- Pouyan GhasemiPGPouyan Ghasemi
- Abhishek GulatiAGAbhishek Gulati
- Mark HarmanMHMark Harman
- Zachary HaluzaZHZachary Haluza
- Mehrdad HonarkhahMHMehrdad Honarkhah
- Herve RobertHRHerve Robert
- Jiacheng LiuJLJiacheng Liu
- Weini LiuWLWeini Liu
- Sreeja ThummalaSTSreeja Thummala
Open Access
- 5 July 2026
- conference paper
- Published by Association for Computing Machinery (ACM)
- p. 282-293
Abstract
No abstract availableAll Related Versions
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