Solid phase epitaxy of diamond cubic SnxGe1−x alloys

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Abstract
Solid phase epitaxy of amorphous SnxGe1−x films on strain relieved Ge films on Si(001) substrates was investigated for alloy compositions in the range 0.02≤x≤0.26. Films with compositions xxGe1−x films with x∼0.05, and excess Sn is segregated in ∼100 nm size domains within the epitaxial alloy film.

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