Abstract
This paper proposes a design of gate all around CNTFET based ternary content addressable memory (TCAM). TCAM cell is designed and simulated in HSPICE using top gated CNTFET (TG-CNTFET) & gate all around CNTTFET (GAA-CNTFET). Dual chirality technique is used to design TCAM cell i.e. different chirality for n-type CNTFET & p-type CNTFET which utilizes different threshold voltages and hence improve the performance. Comparative analysis has been done for various parameters viz. Static noise margin (SNM), delay, power and power delay product (PDP). It has been found that GAA-CNTFET based TCAM gives better SNM and power as compared to TG-CNTFET based TCAM, however TG-CNTFET based TCAM gives less delay.