RL-huffman encoding for test compression and power reduction in scan applications
Authors:
Open Access
- 1 January 2005
- journal article
- Published by Association for Computing Machinery (ACM) in ACM Transactions on Design Automation of Electronic Systems
- Vol. 10 (1) , 91-115
Abstract
This article mixes two encoding techniques to reduce test data volume, test pattern delivery time, and power dissipation in scan test applications. This is achieved by using run-length encoding followed by Huffman encoding. This combination is especially effective when the percentage of don't cares in a test set is high, which is a common case in today's large systems-on-chips (SoCs). Our analysis and experimental results confirm that achieving up to an 89% compression ratio and a 93% scan-in power reduction is possible for scan-testable circuits such as ISCAS89 benchmarks.Keywords
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