Multi-scale GAN with transformer for surface defect inspection of IC metal packages
Authors:
- Kaiqiong ChenKCKaiqiong Chen
- Nian CaiNCNian Cai
- Zhenshuang WuZWZhenshuang Wu
- Hao XiaHXHao Xia
- Shuai ZhouSZShuai Zhou
- Han WangHWHan Wang
- 9 September 2022
- journal article
- research article
- Published by Elsevier in Expert Systems with Applications
- Vol. 212
Abstract
No abstract availableKeywords
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