Advanced processing of differential phase contrast data: Distinction between different causes of electron phase shifts
Authors:
- 12 May 2023
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 250, 113752
Abstract
No abstract availableKeywords
Funding Information
- Deutsche Forschungsgemeinschaft (EXC 2089/1 - 390776260)
This publication has 13 references indexed in Scilit:
- Mapping atomic electric fields and charge densities by four-dimensional STEMActa Crystallographica Section A Foundations and Advances, 2017
- On detector linearity and precision of beam shift detection for quantitative differential phase contrast applicationsUltramicroscopy, 2016
- Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron DiffractionScientific Reports, 2016
- Atomic electric fields revealed by a quantum mechanical approach to electron picodiffractionNature Communications, 2014
- NIH Image to ImageJ: 25 years of image analysisNature Methods, 2012
- Probing the electrostatic potential of charged dislocations inandepilayers by transmission electron holographyPhysical Review B, 2006
- Quantitative Fresnel Lorentz microscopy and the transport of intensity equationUltramicroscopy, 2006
- Quantitative imaging of magnetic domain walls in thin films using Lorentz and magnetic force microscopiesJournal of Applied Physics, 2001
- Magnetization reconstruction from differential phase contrast Lorentz microscopy and magnetic force microscopyIEEE Transactions on Magnetics, 1998
- Reconstruction of the magnetization in a thin film by a combination of Lorentz microscopy and external field measurementsIEEE Transactions on Magnetics, 1989