A review of DASIE code family: contribution to SEU/MBU understanding
Authors:
- G. HubertGHG. Hubert
- N. BuardNBN. Buard
- C. WeulersseCWC. Weulersse
- T. CarriereTCT. Carriere
- M.-C. PalauMPM.-C. Palau
- J.-M. PalauJPJ.-M. Palau
- D. LambertDLD. Lambert
- J. BaggioJBJ. Baggio
- F. WrobelFWF. Wrobel
- F. SaigneFSF. Saigne
- R. GaillardRGR. Gaillard
- 1 January 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 87-94
Abstract
DASIE (the detailed analysis of secondary ion effect) is the name of a code family dedicated to the SEE rate prediction. This paper presents a review of DASIE code family and its contributions to SEU (single event upset) and MBU (multiple bit upset) understanding.Keywords
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