High Performance Predictable Quantum Efficient Detector Based on Induced-Junction Photodiodes Passivated with SiO2/SiNx
Authors:
- Ozhan KoybasiOKOzhan Koybasi
- Ørnulf NordsethØNØrnulf Nordseth
- Trinh TranTTTrinh Tran
- Marco PovoliMPMarco Povoli
- Mauro RajteriMRMauro Rajteri
- Carlo PepeCPCarlo Pepe
- Eivind BardalenEBEivind Bardalen
- Farshid ManoocheriFMFarshid Manoocheri
- Anand SummanwarASAnand Summanwar
- Mikhail KorpusenkoMKMikhail Korpusenko
- Michael N. GetzMGMichael N. Getz
- Per OhlckersPer Ohlckers
Open Access
Abstract
We performed a systematic study involving simulation and experimental techniques to develop induced-junction silicon photodetectors passivated with thermally grown SiO2 and plasma-enhanced chemical vapor deposited (PECVD) SiNx thin films that show a record high quantum efficiency. We investigated PECVD SiNx passivation and optimized the film deposition conditions to minimize the recombination losses at the silicon–dielectric interface as well as optical losses. Depositions with varied process parameters were carried out on test samples, followed by measurements of minority carrier lifetime, fixed charge density, and optical absorbance and reflectance. Subsequently, the surface recombination velocity, which is the limiting factor for internal quantum deficiency (IQD), was obtained for different film depositions via 2D simulations where the measured effective lifetime, fixed charge density, and substrate parameters were used as input. The quantum deficiency of induced-junction photodiodes that would be fabricated with a surface passivation of given characteristics was then estimated using improved 3D simulation models. A batch of induced-junction photodiodes was fabricated based on the passivation optimizations performed on test samples and predictions of simulations. Photodiodes passivated with PECVD SiNx film as well as with a stack of thermally grown SiO2 and PECVD SiNx films were fabricated. The photodiodes were assembled as light-trap detector with 7-reflections and their efficiency was tested with respect to a reference Predictable Quantum Efficient Detector (PQED) of known external quantum deficiency. The preliminary measurement results show that PQEDs based on our improved photodiodes passivated with stack of SiO2/SiNx have negligible quantum deficiencies with IQDs down to 1 ppm within 30 ppm measurement uncertainty.Keywords
Funding Information
- EMPIR programme co-financed by the Participating States and from the European Union’s Horizon 2020 research and innovation programme. (18SIB10 chipS.CALe)
- Norges Forskningsråd (Tildeling av grunnbevilgning for 2021 – prosjektnr. 194068/F40)
- Academy of Finland Flagship Programme, Photonics Research and Innovation (PREIN) (320167)
This publication has 29 references indexed in Scilit:
- Characterisation and optimisation of PECVD SiNx as an antireflection coating and passivation layer for silicon solar cellsAIP Advances, 2013
- Simulations of a predictable quantum efficient detector with PC1DMetrologia, 2012
- Controlling the fixed charge and passivation properties of Si(100)/Al2O3 interfaces using ultrathin SiO2 interlayers synthesized by atomic layer depositionJournal of Applied Physics, 2011
- Reflectance calculations for a predictable quantum efficient detectorMetrologia, 2009
- High‐quality surface passivation of silicon solar cells in an industrial‐type inline plasma silicon nitride deposition systemProgress in Photovoltaics: Research and Applications, 2004
- Highest-quality surface passivation of low-resistivity p-type silicon using stoichiometric PECVD silicon nitrideSolar Energy Materials and Solar Cells, 2001
- Silicon photodiode device with 100% external quantum efficiencyApplied Optics, 1983
- Complete collection of minority carriers from the inversion layer in induced junction diodesJournal of Applied Physics, 1981
- Spectral response self-calibration and interpolation of silicon photodiodesApplied Optics, 1980
- Silicon UV-Photodiodes Using Natural Inversion LayersPhysica Scripta, 1978