Direct comparison of photoemission spectroscopy and in situ Kelvin probe work function measurements on indium tin oxide films
Authors:
- A.J. CascioACA.J. Cascio
- R. SchlafRSR. Schlaf
Top Cited Papers
- 1 June 2006
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 152 (1-2) , 12-17
Abstract
No abstract availableKeywords
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