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Publications
An Investigation Into the Effects of the Gate Drive Resistance on the Losses of the MOSFET–Snubber–Diode Configuration
Publication with shared reference
10.1109/tpel.2011.2171723
Home
Publications
An Investigation Into the Effects of the Gate Drive Resistance on the Losses of the MOSFET–Snubber–Diode Configuration
Publication with shared reference
10.1109/tpel.2011.2171723
Publications with shared reference:
An Investigation Into the Effects of the Gate Drive Resistance on the Losses of the MOSFET–Snubber–Diode Configuration
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