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Hall effect measurements of hole mobility in an inversion layer at the Si-SiO2 interface
Publication with shared reference
10.1002/pssa.2210050123
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Hall effect measurements of hole mobility in an inversion layer at the Si-SiO2 interface
Publication with shared reference
10.1002/pssa.2210050123
Publications with shared reference:
Hall effect measurements of hole mobility in an inversion layer at the Si-SiO2 interface
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