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Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET
Publication with shared reference
10.1016/j.microrel.2022.114784
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Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET
Publication with shared reference
10.1016/j.microrel.2022.114784
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Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET
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