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Reliability of GaN HEMTs: Degradation Mechanisms, Multi-Field Coupling Effects, and Optimization Strategies
Publication with shared reference
10.1109/edr.2026.3746248
Home
Publications
Reliability of GaN HEMTs: Degradation Mechanisms, Multi-Field Coupling Effects, and Optimization Strategies
Publication with shared reference
10.1109/edr.2026.3746248
Publications with shared reference:
Reliability of GaN HEMTs: Degradation Mechanisms, Multi-Field Coupling Effects, and Optimization Strategies
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