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Publications
Gate oxide reliability assessment of a SiC MOSFET for high temperature aeronautic applications
Publication with shared reference
10.1109/ecce-asia.2013.6579125
Home
Publications
Gate oxide reliability assessment of a SiC MOSFET for high temperature aeronautic applications
Publication with shared reference
10.1109/ecce-asia.2013.6579125
Publications with shared reference:
Gate oxide reliability assessment of a SiC MOSFET for high temperature aeronautic applications
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